The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Jul. 01, 2019
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventors:

Stephan Biber, Erlangen, DE;

David Grodzki, Erlangen, DE;

Katharina Hesels, Erlangen, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 33/565 (2006.01); G01R 33/385 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56572 (2013.01); G01R 33/385 (2013.01);
Abstract

In an magnetic resonance imaging (MRI) system and a method for controlling a magnetic field gradient applied in the MRI system during an imaging sequence, a first gradient parameter representing a first maximum value of the applicable magnetic field gradients applied over time is determined in view heat generated by the applied magnetic field gradients. A second gradient parameter representing a second maximum value of the applicable magnetic field gradients applied over time is also determined in view heat generated by the applied magnetic field gradients, the second maximum value being different from the first maximum value. A current operating parameter of the MRI system is determined, and either the first gradient parameter or the second gradient parameter is selected for the imaging sequence, dependent on the determined current operating parameter.


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