The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

Jan. 31, 2018
Applicant:

Massachusetts Institute of Technology, Cambridge, MA (US);

Inventor:

Eric Judson VanWyk, Somerville, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3183 (2006.01); G01R 31/317 (2006.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318378 (2013.01); G01R 31/31703 (2013.01); G01R 31/31922 (2013.01);
Abstract

An equivalent time network analyzer and method estimates a device-under-test's frequency response by acquiring its time domain response through equivalent time over-sampling. The analyzer has a timing system producing two time bases differing in period by less than one part per million, resulting in a linearly varying phase difference. A high frequency stimulus generator, synchronized to the first time basis, creates a periodic waveform that contains energy at harmonics of the first time basis. An output capture cell that captures the response of the device-under-test includes a high bandwidth input comparator, a memory element clocked to the second time basis, and a low bandwidth feedback filter that provides a low frequency analog estimate of the time domain response of the device-under-test as feedback to the input comparator and as output from the capture cell. The analyzer may also include input capture cells, multiple stimulus generators, and/or multiple output capture cells.


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