The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 25, 2021

Filed:

May. 09, 2016
Applicant:

Hitachi, Ltd., Tokyo, JP;

Inventors:

Yoshinobu Kimura, Tokyo, JP;

Junichi Sakano, Tokyo, JP;

Kimihisa Furukawa, Tokyo, JP;

Takashi Ogawa, Tokyo, JP;

Renichi Yamada, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2020.01); B60L 3/00 (2019.01); G01K 7/01 (2006.01); H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2619 (2013.01); B60L 3/003 (2013.01); G01K 7/01 (2013.01); G01R 31/26 (2013.01); G01R 31/2642 (2013.01); H03M 1/12 (2013.01); G01K 2217/00 (2013.01);
Abstract

A diagnostic system for a power conversion apparatus including a semiconductor device and performing a switching operation for carrying and interrupting a main current to a main current is disclosed. This system includes a trigger circuit that acquires reference time for the switching operation; and a delay time calculation circuit that acquires first time at which the main current takes a first main current set value and second time at which the main current takes a second main current set value, and that detects numerical data about a difference between the first time and the reference time and numerical data about a difference between the second time and the reference time.


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