The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2021
Filed:
Apr. 11, 2017
Applicants:
Alexander A. Ukhanov, Albuquerque, NM (US);
Gennady A. Smolyakov, Albuquerque, NM (US);
Fei Hung Chu, Albuquerque, NM (US);
Chengao Wang, Albuquerque, NM (US);
Inventors:
Alexander A. Ukhanov, Albuquerque, NM (US);
Gennady A. Smolyakov, Albuquerque, NM (US);
Fei Hung Chu, Albuquerque, NM (US);
Chengao Wang, Albuquerque, NM (US);
Assignee:
ACTOPROBE LLC, Albuquerque, NM (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01Q 60/38 (2010.01);
U.S. Cl.
CPC ...
G01Q 60/38 (2013.01);
Abstract
A new monolithic Atomic Force Microscopy (AFM) active optical probe monolithically integrates a base of the probe, a cantilever, a semiconductor laser source, an AFM tip, and a photodetector into a robust, easy-to-use single semiconductor chip to enable AFM measurements, optical imaging, and optical spectroscopy at the nanoscale.