The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2021
Filed:
Feb. 09, 2017
Sekisui Chemical Co., Ltd., Osaka, JP;
University Public Corporation Osaka, Osaka, JP;
Yoshinori Akagi, Osaka, JP;
Nobuhiko Inui, Osaka, JP;
Kazuhiko Imamura, Osaka, JP;
Takamasa Kouno, Osaka, JP;
Shigeru Nomura, Osaka, JP;
Tatsuro Endo, Sakai, JP;
SEKISUI CHEMICAL CO., LTD., Osaka, JP;
UNIVERSITY PUBLIC CORPORATION OSAKA, Osaka, JP;
Abstract
Provided is an implement for inspection capable of measuring the concentration of a test substance with high accuracy. The implement for inspection according to the present invention is an implement for inspection used for measuring the concentration of a test substance that includes a compound for reacting with a test substance to form a granular substance or a compound which is for being bound to the test substance and is a granular substance, and a wall portion having a periodic structure on its surface.