The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2021
Filed:
Aug. 24, 2018
Applicant:
3m Innovative Properties Company, St. Paul, MN (US);
Inventor:
David H. Redinger, Afton, MN (US);
Assignee:
3M INNOVATIVE PROPERTIES COMPANY, St. Paul, MN (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/20 (2006.01); G01N 27/24 (2006.01); G01N 27/82 (2006.01); G01N 27/90 (2021.01); G01N 27/02 (2006.01); G01R 35/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G01N 27/20 (2013.01); G01N 27/02 (2013.01); G01N 27/24 (2013.01); G01N 27/82 (2013.01); G01N 27/9046 (2013.01); G01R 31/2817 (2013.01); G01R 35/007 (2013.01);
Abstract
The disclosure describes techniques for detecting a crack or defect in a material. A computing device may determine whether a tested material includes a crack or other defect based on a temperature-scaled control data set and a measurement data set.