The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2021
Filed:
Apr. 04, 2019
Applicant:
Nichia Corporation, Anan, JP;
Inventors:
Atsushi Yamamoto, Komatsushima, JP;
Takeshi Tamura, Tokushima, JP;
Assignee:
NICHIA CORPORATION, Anan, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 25/075 (2006.01); F21K 9/66 (2016.01); H01L 21/66 (2006.01); H01L 33/46 (2010.01); F21K 9/64 (2016.01); F21K 9/68 (2016.01); F21K 9/90 (2016.01); F21K 9/69 (2016.01); H01L 33/50 (2010.01); F21Y 105/16 (2016.01);
U.S. Cl.
CPC ...
F21K 9/66 (2016.08); F21K 9/64 (2016.08); F21K 9/68 (2016.08); F21K 9/69 (2016.08); F21K 9/90 (2013.01); H01L 22/20 (2013.01); H01L 25/0753 (2013.01); H01L 33/46 (2013.01); H01L 33/507 (2013.01); F21Y 2105/16 (2016.08); H01L 2933/0025 (2013.01); H01L 2933/0041 (2013.01);
Abstract
A method of manufacturing a light source device includes: providing a substrate having a plurality of light sources disposed thereon; causing the plurality of light sources to emit light; measuring a first light-intensity distribution of an entire surface that is in parallel to the substrate and located above the plurality of light sources; and based on a measured value of the first light-intensity distribution, forming a light-reflecting pattern above the plurality of light sources to obtain a second light-intensity distribution that is different from the first light-intensity distribution.