The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 25, 2021
Filed:
Aug. 10, 2018
Applicant:
Solenis Technologies, L.p., Wilmington, DE (US);
Inventor:
Timothy Patterson, Wilmington, DE (US);
Assignee:
SOLENIS TECHNOLOGIES, L.P., Wilmington, DE (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D21F 7/06 (2006.01); D21G 9/00 (2006.01); B31F 1/14 (2006.01); D21H 27/00 (2006.01); D21G 3/00 (2006.01); G01B 11/06 (2006.01);
U.S. Cl.
CPC ...
D21G 9/0036 (2013.01); B31F 1/145 (2013.01); D21F 7/06 (2013.01); D21G 3/005 (2013.01); D21H 27/005 (2013.01); G01B 11/0691 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/20056 (2013.01); G06T 2207/30124 (2013.01);
Abstract
The current method relates to an on-line characterization of paper or paper products, such as tissue or other crepe paper products. The method uses an imaging source wherein one or more images are obtained of the sheets surface or topographical area or region, or the image is of an edge of a formed sheet. The one or more images are enhanced and analyzed using various techniques and metrics for characterizing the structure of the formed sheet. The information provides for real time adjustments on the machine.