The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2021

Filed:

Dec. 04, 2019
Applicant:

Amazon Technologies, Inc., Seattle, WA (US);

Inventor:

Kiran K Seshadri, Cedar Park, TX (US);

Assignee:

Amazon Technologies, Inc., Seattle, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/00 (2014.01); H04N 19/56 (2014.01); H04N 19/176 (2014.01); H04N 19/14 (2014.01); H04N 19/103 (2014.01);
U.S. Cl.
CPC ...
H04N 19/56 (2014.11); H04N 19/103 (2014.11); H04N 19/14 (2014.11); H04N 19/176 (2014.11);
Abstract

Methods and hardware implementations for determining a motion vector between a first frame and a second frame. A block is obtained from the first frame. A reference window is obtained from the second frame. A set of lines are obtained from the block. The set of lines are delayed using a set of delay elements to produce a set of delayed lines. For each location of a search pattern comprising a plurality of locations arranged in a set of rows, a reference window line is obtained from the reference window, a block line is obtained from the set of delayed lines based on which row of the set of rows the location belongs to, and a similarity score of a plurality of similarity scores is accumulated based on the reference window line and the block line. A target location is identified by comparing the plurality of similarity scores.


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