The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2021
Filed:
Jul. 26, 2019
Applicants:
Vatech Co., Ltd., Gyeonggi-do, KR;
Vatech Ewoo Holdings Co., Ltd., Gyeonggi-do, KR;
Inventor:
Sung Il Choi, Gyeonggi-do, KR;
Assignees:
VATECH Co., Ltd., Gyeonggi-do, KR;
VATECH EWOO Holdings Co., Ltd., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/254 (2018.01); G01B 11/25 (2006.01); H04N 13/257 (2018.01); A61C 9/00 (2006.01); H04N 1/00 (2006.01); A61C 13/00 (2006.01);
U.S. Cl.
CPC ...
H04N 13/254 (2018.05); G01B 11/2509 (2013.01); G01B 11/2513 (2013.01); H04N 13/257 (2018.05); A61C 9/006 (2013.01); A61C 9/0053 (2013.01); A61C 13/0004 (2013.01); H04N 1/00827 (2013.01);
Abstract
The disclosure is related to a method and apparatus of scanning a target object in three dimensions (3D). The method may include projecting a color dashed line pattern onto a target object, scanning the target object with the color dashed line pattern projected thereto, and producing a 3D data of the target object by processing the scanning result. The color dashed line pattern may include multiple dashed line patterns each of which is individually used to calculate the 3D data of the target object.