The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2021

Filed:

Aug. 06, 2018
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventor:

Osamu Yonishi, Chigasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); H04N 5/225 (2006.01); H04N 5/445 (2011.01);
U.S. Cl.
CPC ...
H04N 5/232933 (2018.08); H04N 5/2259 (2013.01); H04N 5/23203 (2013.01); H04N 5/23206 (2013.01); H04N 5/23216 (2013.01); H04N 5/23299 (2018.08); H04N 5/232945 (2018.08); H04N 5/44504 (2013.01);
Abstract

An information processing apparatus includes an obtaining unit configured to obtain first setting information including information related to a first specified area in an image and related to image analysis processing and second setting information including information related to a second specified area in the image and related to the image analysis processing of the same type as the first setting information, wherein the second setting information has been created before the first setting information, a determination unit configured to determine an overlapped area of the first and second specified areas on a basis of the first setting information and the second setting information, and a decision unit configured to decide processing to be executed with respect to at least one of the first setting information and the second setting information in accordance with a determination result of the determination unit.


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