The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2021

Filed:

Nov. 01, 2019
Applicant:

Vivotek Inc., New Taipei, TW;

Inventors:

Hsiang-Sheng Wang, New Taipei, TW;

Shih-Hsuan Chen, New Taipei, TW;

Assignee:

VIVOTEK INC., New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/20 (2017.01); H04N 5/14 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/142 (2013.01); G06K 9/00335 (2013.01); G06K 9/00369 (2013.01); G06T 7/20 (2013.01);
Abstract

An image analyzing method of detecting a dimension of a region of interest inside an image is applied to an image analyzing device. The image analyzing method includes positioning an initial triggering pixel unit within a detective identifying area inside the image, and assigning a first detection region via a center of the initial triggering pixel unit, positioning a first based pixel unit conforming to a first target value inside the first detection region, applying a mask via a center of the first based pixel unit to determine whether a first triggering pixel unit exists inside the mask, and utilizing a determination result of the initial triggering pixel unit and the first triggering pixel unit to decide a maximal dimension of the region of interest.


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