The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2021
Filed:
Feb. 14, 2019
Samsung Electronics Co., Ltd., Gyeonggi-do, KR;
Ikbeom Lee, Gyeonggi-do, KR;
Chongdon Kim, Gyeonggi-do, KR;
Youngtaek Bae, Gyeonggi-do, KR;
Hayoung Yang, Gyeonggi-do, KR;
Abstract
The present disclosure provides a method for measuring an amount of interference from an antenna, the method comprising the operations of: receiving at least on reference symbol; calculating a reference symbol NI, which is the antenna-related noise interference (NI) in the at least one reference symbol, on the basis of the at least one reference symbol; receiving at least one data symbol; calculating a data symbol NI, which is the antenna-related NI in the data symbol, on the basis of the at least one data symbol; calculating an NI ratio of the antenna which is the ratio of the data symbol NI relative to the reference symbol NI; and determining an antenna weight of the antenna on the basis of the NI ratio.