The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2021
Filed:
Dec. 28, 2016
Applicant:
Intel Corporation, Santa Clara, CA (US);
Inventors:
Vladimir Oksman, Morganville, NJ (US);
Dietmar Schoppmeier, Unterhaching, DE;
Assignee:
MaxLinear, Inc., Carlsbad, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/345 (2015.01); H04L 1/00 (2006.01); H04L 1/08 (2006.01); H04L 1/20 (2006.01); H04B 1/38 (2015.01);
U.S. Cl.
CPC ...
H04B 17/345 (2015.01); H04L 1/0041 (2013.01); H04L 1/0045 (2013.01); H04L 1/08 (2013.01); H04L 1/201 (2013.01); H04B 1/38 (2013.01);
Abstract
A transceiver and associated method an impulse noise monitoring (INM) tool configured to identify a data stream that includes i) data transmission units (DTUs) communicating data symbols, ii) non-data symbols, and iii) non-transmission time. The INM tool is configured to ascertain an impulse noise (IN) event of the incoming data stream by evaluating a count, a frequency, a pattern, a group, or a sequence of corrupted DTUs and selected non-data symbols or non-transmission time that are proximate in time to the corrupted DTUs.