The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2021

Filed:

Mar. 07, 2018
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Kazuhiro Miyasa, Narashino, JP;

Kiyohide Satoh, Kawasaki, JP;

Ryo Ishikawa, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/33 (2017.01); G06T 3/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0016 (2013.01); G06T 3/0081 (2013.01); G06T 7/33 (2017.01); G06T 7/97 (2017.01); G06T 2207/10072 (2013.01); G06T 2207/30068 (2013.01);
Abstract

An image processing apparatus comprises a corresponding point obtaining unit configured to obtain corresponding points that are feature points of an object associated between a first image and a second image; a first deformation obtaining unit configured to obtain first deformation that is based on the corresponding points; a second deformation obtaining unit configured to obtain second deformation that is performed between the first image and the second image, and in which a degree of coincidence of corresponding points is lower than the first deformation; and a combining unit configured to combine the first deformation and the second deformation, regarding positions in at least one image of the first Image and the second image, based on distances between the corresponding points and the positions.


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