The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2021
Filed:
Feb. 05, 2019
The Regents of the University of California, Oakland, CA (US);
Rajesh Gupta, La Jolla, CA (US);
Jeng-Hau Lin, La Jolla, CA (US);
Yunfan Yang, La Jolla, CA (US);
Zeyu Chen, La Jolla, CA (US);
Zhuowen Tu, La Jolla, CA (US);
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, Oakland, CA (US);
Abstract
Disclosed are devices, systems and methods for providing efficient implementations for pattern recognition. Embodiments of the disclosed technology use local binary comparisons and random projection in place of conventional convolution operations. Some embodiments of the disclosed technology provide an important means to improve memory and speed efficiency that is particularly suited for small footprint devices and hardware accelerators. Other embodiments compare a binary pattern to one or more portions of an input image to determine a plurality of binary results, and generate an estimate of the feature based on the plurality of binary results. Yet other embodiments generate an final image, comprising a final estimate of the feature, by randomly selecting one or more portions from each of a plurality of initial images, wherein each of the plurality of initial images comprises an initial estimate of the feature.