The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2021
Filed:
Jul. 08, 2019
Fujitsu Limited, Kawasaki, JP;
Fumiyuki Takahashi, Atsugi, JP;
Tetsuo Koezuka, Hachioji, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
An apparatus includes a processor that matches of local-feature-amounts in a state where an image of a measurement target captured by an image-sensor and a projective-transformed image of three-dimensional design data of the measurement target substantially overlap each other on a display to search the captured image and a virtual image generated from the projective-transformed image for a plurality of feature-point pairs with similar local-feature-amounts of an image, estimates a temporary-external-parameter related to a position and orientation of the image-sensor, compares an initial-external-parameter and the temporary-external-parameter to diagnose reliability of the temporary-external-parameter, and selects, among the feature-point pairs, a specified number of feature-point pairs with a score value indicating similarity between two feature-points forming each feature-point pair equal to or higher than a threshold value, estimate a final-external-parameter using the selected feature-point pairs, and display the captured image and the projective-transformed image in a superimposing manner using the external-parameter.