The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2021

Filed:

Apr. 27, 2018
Applicants:

Deshan Yang, St. Louis, MO (US);

YE Duan, Columbia, MO (US);

Inventors:

Deshan Yang, St. Louis, MO (US);

Ye Duan, Columbia, MO (US);

Assignees:

Washington University, St. Louis, MO (US);

The Curators of The University of Missouri, Columbia, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06T 7/00 (2017.01); G06T 7/33 (2017.01); G06K 9/40 (2006.01); G06K 9/44 (2006.01); G06K 9/62 (2006.01); G06T 7/246 (2017.01);
U.S. Cl.
CPC ...
G06K 9/4609 (2013.01); G06K 9/40 (2013.01); G06K 9/44 (2013.01); G06K 9/4671 (2013.01); G06K 9/6212 (2013.01); G06T 7/0016 (2013.01); G06T 7/246 (2017.01); G06T 7/33 (2017.01); G06T 7/337 (2017.01); G06K 2209/05 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/10088 (2013.01); G06T 2207/20016 (2013.01); G06T 2207/20028 (2013.01);
Abstract

A computer-implemented method for detecting landmark pairs in a pair of images is provided. The method includes receiving a pair of images, sampling the pair of images to generate reduced-resolution pairs of images, identifying features in the reduced-resolution pairs of images, matching the features in the image pairs, using the matched features in an increased resolution pair of images as guides for feature matching, and through iteratively guiding feature matching, identifying landmarks in the full-resolution pair of images.


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