The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2021

Filed:

Jun. 29, 2018
Applicant:

Microsoft Technology Licensing, Llc, Redmond, WA (US);

Inventors:

Christopher Granade, Redmond, WA (US);

Nathan O. Wiebe, Redmond, WA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/16 (2006.01); G06N 10/00 (2019.01); G06N 5/00 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06F 17/16 (2013.01); G06N 5/003 (2013.01); G06N 7/005 (2013.01); G06N 10/00 (2019.01);
Abstract

The disclosed technology concerns example embodiments for estimating eigenvalues of quantum operations using a quantum computer. Such estimations are useful in performing Shor's algorithm for factoring, quantum simulation, quantum machine learning, and other various quantum computing applications. Existing approaches to phase estimation are sub-optimal, difficult to program, require prohibitive classical computing, and/or require too much classical or quantum memory to be run on existing devices. Embodiments of the disclosed approach address one or more (e.g., all) of these drawbacks. Certain examples work by using a random walk for the estimate of the eigenvalue that (e.g., only) keeps track of the current estimate and the measurement record that it observed to reach that point.


Find Patent Forward Citations

Granade, Christopher. (2021). Using random walks for iterative phase estimation (U.S. Patent No. 11010450). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11010450

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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