The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2021
Filed:
Oct. 19, 2017
Omron Corporation, Kyoto, JP;
Shinsuke Kawanoue, Kyoto, JP;
Yoshihide Nishiyama, Yokohama, JP;
OMRON Corporation, Kyoto, JP;
Abstract
A controller includes a feature quantity generation unit that generates, from data associated with a control target, a feature quantity appropriate for detecting an abnormality in the control target, a machine learning unit that performs machine learning using the feature quantity, an abnormality detection unit that detects the abnormality based on an abnormality detection parameter determined from a learning result of the machine learning, and the feature quantity, an instruction unit that instructs the abnormality detection unit to detect the abnormality, and a data compression unit that compresses data about the feature quantity and provides the compressed data to the machine learning unit and the abnormality detection unit. The instruction unit transmits a request for detecting the abnormality to the abnormality detection unit. The abnormality detection unit detects the abnormality without returning a response to the request.