The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2021
Filed:
Dec. 07, 2016
Canon Kabushiki Kaisha, Tokyo, JP;
Michiie Sakamoto, Tokyo, JP;
Akinori Hashiguchi, Tokyo, JP;
Shinobu Masuda, Tokyo, JP;
Tsuguhide Sakata, Machida, JP;
Tsutomu Shimada, Musashino, JP;
Hirotake Ando, Tokyo, JP;
Akihiro Sakai, Yokohama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A microscope system includes a microscope body, a camera connected to an observation optical system of the microscope body, and an XY stage on which a slide of an observation object is placed and which is configured to move in an X-axis direction and a Y-axis direction that are orthogonal to each other. The XY stage includes an XY two-dimensional scale plate. The XY two-dimensional scale plate includes a first mark configured to provide X-axis direction axis information and Y-axis direction axis information of the stage, and a second mark which is provided within an observable region of the camera on the same plane as the first mark and which is available for recognizing a position of an XY plane of the first mark in a Z-axis direction at each of a plurality of points by focus detection of the camera.