The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2021
Filed:
May. 05, 2020
Industry-academic Cooperation Foundation, Yonsei University, Seoul, KR;
Small Machines, Daejeon, KR;
Chul Min Joo, Goyang-si, KR;
Seung Ri Song, Seoul, KR;
Sunwoong Hur, Gwangju-si, KR;
Jun Kyu Choi, Seoul, KR;
Chang Hyuk Yoo, Seoul, KR;
Industry-Academic Cooperation Foundation, Yonsei University, Seoul, KR;
Small Machines, Daejeon, KR;
Abstract
Provided are a microscope apparatus and a method for correcting a position of a light source according to an exemplary embodiment of the present disclosure. The microscope apparatus for correcting the position of the light source according to the exemplary embodiment of the present disclosure includes: a light source unit which includes a light emitting element array including multiple light emitting elements and is configured to emit light to a subject; an optical unit which is disposed in parallel with the subject and configured to form an enlarged image of the subject to which the light is emitted; an image sensor which is configured to acquire the enlarged image of the subject by capturing the enlarged image formed by the optical unit; and a processor which is operably connected to the light source unit, the optical unit, and the image sensor and corrects a position of the light source unit based on the image acquired by the image sensor.