The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2021
Filed:
Dec. 22, 2016
Ascentia Imaging, Inc., Boulder, CO (US);
Edward R. Dowski, Jr., Steamboat Springs, CO (US);
Gregory Johnson, Boulder, CO (US);
ASCENTIA IMAGING, INC., Boulder, CO (US);
Abstract
A method for determining a localization parameter of an object includes generating a plurality of estimates of a first frequency-domain amplitude of a baseband signal from the object, each estimate corresponding one of a plurality of temporal segments of the baseband signal. The method also includes determining the first frequency-domain amplitude as most common value of the plurality of estimates, and determining the localization parameter therefrom. A localization system includes a memory and a microprocessor. The memory stores instructions and is configured to store a baseband signal having a temporal frequency component and a corresponding first frequency-domain amplitude. The microprocessor is adapted to execute the instructions to: (i) generate a plurality of estimates of the first frequency-domain amplitude each corresponding to a respective one of a plurality of temporal segments of the baseband signal, and (ii) determine the first frequency-domain amplitude as the most common value of the estimates.