The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2021

Filed:

Sep. 11, 2019
Applicants:

Inventec (Pudong) Technology Corporation, Shanghai, CN;

Inventec Corporation, Taipei, TW;

Inventors:

Yan qing Zhang, Shanghai, CN;

Hong bin Zhu, Shanghai, CN;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 1/04 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2886 (2013.01); G01R 1/0441 (2013.01); G01R 31/2863 (2013.01);
Abstract

A socket testing method comprises obtaining a raw socket image, performing binarization on the raw socket image to generate a binarized socket image, determining a plurality of pinhead locations in the binarized socket image, applying a grid with the grid including a plurality of intersections to the binarized socket image, for each of the plurality of pinhead locations, obtaining the distance between the pinhead location and one of the plurality of intersections which is nearest to the pinhead location, and outputting a warning signal associated with the pinhead location when determining that the distance is larger than a tolerance value.


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