The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2021

Filed:

Aug. 04, 2017
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Takuya Takahashi, Tokyo, JP;

Hitoshi Tokieda, Tokyo, JP;

Eiichiro Takada, Tokyo, JP;

Masashi Fukaya, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/10 (2006.01); G01N 35/04 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00584 (2013.01); G01N 35/04 (2013.01); G01N 35/10 (2013.01); G01N 35/109 (2013.01); G01N 35/1065 (2013.01); G01N 35/1004 (2013.01); G01N 2035/00534 (2013.01); G01N 2035/0406 (2013.01); G01N 2035/0443 (2013.01); G01N 2035/0453 (2013.01);
Abstract

An automatic analyzer capable of controlling an interval between the tip of a sample nozzle and the bottom of a reaction container regardless of individual differences between reaction containers and sample nozzles and suppressing adhesion of a sample to the sample nozzle is disclosed. Sample nozzlesandare moved toward the bottom surface of a reaction container, the movement of the sample nozzles is stopped at a point in time when a stop position detectordetects a stop position detection plate, the sample nozzles are ascended from the stop position to a position where the stop position detection plateseparates from a detection range of the stop position detector, and an armis moved upward by a moving distance stored in a memory.


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