The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2021
Filed:
Oct. 21, 2019
Gen-probe Incorporated, San Diego, CA (US);
Norbert D. Hagen, Carlsbad, CA (US);
David Opalsky, San Diego, CA (US);
George T. Walker, San Diego, CA (US);
Byron J. Knight, San Diego, CA (US);
GEN-PROBE INCORPORATED, San Diego, CA (US);
Abstract
Optical reference devices for calibrating or monitoring the performance of an optical measurement device, such as a fluorometer, are made from thermoplastics from the polyaryletherketone (PAEK) family of semi-crystalline thermoplastics, including polyether ether ketone (PEEK). The reference device may be made as a master reference device having a known emission output—as determined by a standard optical measurement device—that is used to calibrate other optical measurement devices against the standard. The reference device may be made in the shape of a receptacle vial so that the reference device can be placed in the receptacle holding structure of an instrument in which the optical measurement device is installed and used to calibrate or monitor the optical measurement device within the instrument. The reference device may be part of the probe of a pipettor or pick and place mechanism or it may be a cap that can be secured to the end of such a probe.