The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2021

Filed:

Nov. 25, 2019
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Shinya Wakuda, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01N 21/25 (2006.01); G01N 21/359 (2014.01); G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
G01N 21/274 (2013.01); G01N 21/255 (2013.01); G01N 21/359 (2013.01); G01N 2021/3595 (2013.01); G01N 2201/0612 (2013.01); G01N 2201/06106 (2013.01); G01N 2201/12746 (2013.01);
Abstract

In an FTIR, a beam splitter, fixed mirrorand movable mirrorare shared by a main interferometerincluding a multiwavelength infrared light sourceand a control interferometerincluding a semiconductor laser. A first detectordetects infrared interference light generated by the main interferometerand transmitted through or reflected by a sample. A second detectordetects monochromatic interference light generated by the control interferometer. A spectrum creatordetermines an optical path difference between an optical path via the fixed mirrorand an optical path via the movable mirror, based on the intensity and uncalibrated oscillation wavelength of the monochromatic interference light detected by the second detector, and creates a spectrum by performing fast Fourier transform on an interferogram which shows a distribution of the intensity of the infrared interference light detected by the first detectorwith respect to the optical path difference. An oscillation wavelength calibratorlocates an absorption peak of carbon dioxide from the peaks in the spectrum created by the spectrum creator, and compares a wavenumber or wavelength of the absorption peak with a true absorption wavenumber or wavelength of carbon dioxide to determine a calibrated oscillation wavelength of the semiconductor laser


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