The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2021
Filed:
Jul. 31, 2017
Mitsubishi Electric Corporation, Tokyo, JP;
Katsuyuki Kamei, Tokyo, JP;
Masashi Watanabe, Tokyo, JP;
Hiroyuki Fujibayashi, Tokyo, JP;
Megumi Irie, Tokyo, JP;
MITSUBISHI ELECTRIC CORPORATION, Tokyo, JP;
Abstract
The interior of a first measurement surface and the interior of a second measurement surface traveling together with a measuring vehicle are scanned to acquire first measurement coordinate points and second measurement coordinate points, respectively. A first comparison point cloud representing a comparison part on a surface of a structure is extracted from the first measurement coordinate points. A second comparison point cloud representing a comparison part on the surface of the structure is extracted from the second measurement coordinate points. A difference between the first comparison point cloud and the second comparison point cloud corresponding to measurement of a common comparison part on the surface of the structure is calculated. Error having time dependence included in the first measurement coordinate points and the second measurement coordinate points is calculated on the basis of the calculated difference. The measurement coordinate points are corrected on the basis of the calculated error.