The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2021
Filed:
May. 16, 2019
Haag-streit Ag, Koeniz, CH;
Lucio Robledo, Bern, CH;
Pascal Kesselring, Bern, CH;
HAAG-STREIT AG, Koeniz, CH;
Abstract
In a method for calibrating an interferometer () having a beam path for a measuring beam (), wherein at least one plane () that at least partially reflects the measuring beam () has been introduced into the beam path, and wherein a normal to a first plane () is inclined at a first angle to a measuring beam () incident on the first plane (), the following steps are carried out: interferometric measurement of a first axial spacing of a first point on the first plane () with the measuring beam (), and interferometric measurement of a second axial spacing of a second point on one of the at least one plane () with the measuring beam (), wherein the second point is spaced apart from the first point.