The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2021

Filed:

Dec. 20, 2018
Applicant:

Soulbrain Co., Ltd., Seongnam-si, KR;

Inventors:

Hye Kyung So, Seongnam-si, KR;

Myeong Hoon Han, Seongnam-si, KR;

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C09G 1/04 (2006.01); H01L 21/3105 (2006.01); C23F 1/10 (2006.01); H01L 21/321 (2006.01);
U.S. Cl.
CPC ...
C09G 1/04 (2013.01); H01L 21/31053 (2013.01); C23F 1/10 (2013.01); H01L 21/3212 (2013.01);
Abstract

The present invention relates to a polishing composition, and more particularly, to a chemical mechanical polishing (CMP) composition used to chemically and mechanically polish a semiconductor wafer. The polishing composition of the present invention, by comprising anion-modified silica polishing particles in which the zeta potential (ζ) is ≤−10 mV, can exhibit excellent polishing performance, and more specifically, which can achieve a high polishing rate with respect to an indium-containing polishing substrate, while improving the dispersibility of the composition and reducing residual defects on the substrate.


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