The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2021

Filed:

Oct. 08, 2020
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Hideki Yasuda, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B32B 15/08 (2006.01); G02B 5/28 (2006.01); B32B 17/10 (2006.01); G02B 5/26 (2006.01); C03C 17/32 (2006.01); G02B 13/14 (2006.01); B32B 13/14 (2006.01);
U.S. Cl.
CPC ...
B32B 15/08 (2013.01); B32B 17/1022 (2013.01); B32B 17/10036 (2013.01); B32B 17/10449 (2013.01); C03C 17/32 (2013.01); G02B 5/26 (2013.01); G02B 5/282 (2013.01); G02B 13/14 (2013.01); B32B 2307/304 (2013.01); B32B 2307/416 (2013.01);
Abstract

Provided are a far infrared reflective film including a base material and a far infrared reflective layer including a binder and flat conductive particles, in which a value obtained by dividing an average particle diameter of the flat conductive particles by an average thickness of the flat conductive particles is 20 or more, a thickness y nm of the far infrared reflective layer is 3 times or more the average thickness of the flat conductive particles, a volume fraction x of the flat conductive particles in the far infrared reflective layer is 0.4 or more, and a product x×y of the volume fraction x and the thickness y satisfies Expression A, a heat shield film including the far infrared reflective film, and a heat shield glass including the far infrared reflective film.


Find Patent Forward Citations

Loading…