The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 18, 2021

Filed:

Jun. 03, 2019
Applicant:

Emods Technology, L.l.c., Georgetown, TX (US);

Inventor:

Paul Dabney, Georgetown, TX (US);

Assignee:

EMODs Technology, L.L.C., Georgetown, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61L 2/10 (2006.01); B01J 19/12 (2006.01); B08B 7/00 (2006.01); B08B 9/027 (2006.01); B08B 9/08 (2006.01); B08B 17/00 (2006.01); C02F 1/72 (2006.01); E21B 21/06 (2006.01);
U.S. Cl.
CPC ...
B08B 7/0057 (2013.01); A61L 2/10 (2013.01); B01J 19/123 (2013.01); B08B 7/0035 (2013.01); B08B 9/027 (2013.01); B08B 9/08 (2013.01); B08B 17/00 (2013.01); C02F 1/72 (2013.01); E21B 21/068 (2013.01); C02F 2303/20 (2013.01); C02F 2305/023 (2013.01);
Abstract

Described herein are various methods, systems, and apparatus for reducing and eliminating biofilms from hydrocarbons. A combination of oxidizing agents and radiation of certain wavelengths forms a synergistic reaction. The synergistic reaction generates EMODs, which are effective in reducing microbial count and eliminating or blocking biofilm formation, particularly in anaerobic environments. This synergistic reaction has a relationship to EMOD creation and has a detrimental effect on Microbial Contamination (MC), Microbial Influenced Corrosion (MIC) and biofilm creation. MC, MIC and biofilm can be eliminated or greatly reduced with the treatment methods in or on equipment including pipelines, storage tanks, and refinery processing equipment.


Find Patent Forward Citations

Loading…