The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 18, 2021
Filed:
Jan. 28, 2019
Amo Development, Llc, Santa Ana, CA (US);
Richard J. Copland, Albuquerque, NM (US);
AMO Development, LLC, Santa Ana, CA (US);
Abstract
An instrument includes: one or more scanning mirrors to receive an OCT sample beam and to scan the sample beam in two orthogonal directions; and an optical system to receive the sample beam and provide the sample beam to an eye. The optical system includes: a first lens having a first focal length, disposed along an optical path from the scanning mirror(s) to the eye at a distance from the cornea which is approximately equal to the first focal length, and a second lens disposed along the optical path between the first lens and the scanning mirror(s). The second lens receives the sample beam from the scanning mirror(s) and provides the sample beam to the first lens as a converging beam such that, as the sample beam is scanned, the sample beam passes through a pivot point located along an optical axis between the eye and the first lens.