The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Feb. 11, 2020
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Hagen Eckert, Munich, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A method of performing a distance-to-fault measurement of a signal processing device, comprising: performing a S11 measurement in amplitude and phase with equidistant frequency points assigned to an original frequency space, thereby obtaining original measurement points; calculating a virtual start frequency and a virtual stop frequency based on a start frequency and a stop frequency assigned to the original frequency space; determining virtual equidistant frequency points between the virtual start frequency and the virtual stop frequency; transforming the virtual equidistant frequency points into the original frequency space, thereby obtaining non-equidistant frequency points in the original frequency space; interpolating the original measurement points with respect to the non-equidistant frequency points, thereby obtaining interpolated measurement points; and performing an inverse transformation of the interpolated measurement points. Further, a measurement instrument for performing a distance-to-fault measurement of a signal processing device is described.