The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Apr. 29, 2020
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Rolf Lorenzen, Munich, DE;
Rohde & Schwarz GmbH & Co. KG, Munich, DE;
Abstract
A test system and method of performing a run-time measurement for calibration of a device used for time-of-flight measurement are disclosed. The method comprises: providing a measurement device, a device under test and a directive component having three ports; connecting the directive component to a transmission port of the measurement device and a reception port of the measurement device; generating a signal by a signal generator; forwarding the signal to the directive component; receiving at least a response by a signal receiver; and determining a loop time indicative of the run-time between the directive component and the device under test as well as a time of internal processing of the device under test, wherein the loop time is independent of a signal processing time of a signal path between the measurement device and the directive component.