The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Jan. 10, 2020
Bae Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Mark E. Stuenkel, Goffstown, NH (US);
Mark D. Hickle, Merrimack, NH (US);
BAE Systems Information and Electronic Systems Integration Inc., Nashua, NH (US);
Abstract
Techniques are disclosed for phase detection in a phase-locked loop (PLL) control system, such as a millimeter-wave PLL. A PLL control system includes a voltage-controlled oscillator (VCO) circuit and a sub-sampling phase detector (SSPD). The VCO circuit is configured to generate an oscillating VCO output voltage based at least in part on an error signal generated by the SSPD. The error signal is proportional to a phase difference between an oscillating reference input voltage and the oscillating VCO output voltage. The SSPD includes a switched emitter-follower (SEF) sampling network, also referred to in this disclosure as an SEF circuit. In contrast to existing CMOS-based techniques, the SEF sampling network allows the SSPD to operate up to higher frequencies, for example, greater than 100 GHz, than possible using a CMOS sampler, and is also compatible with BiCMOS processes, which generally do not have access to advanced small-geometry CMOS.