The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

Nov. 16, 2017
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Christelle Charpin-Nicolle, Fontanil-Cornillon, FR;

Béatrice Biasse, Saint Martin d'Uriage, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 45/00 (2006.01);
U.S. Cl.
CPC ...
H01L 45/165 (2013.01); H01L 45/1233 (2013.01); H01L 45/1246 (2013.01); H01L 45/145 (2013.01);
Abstract

A method for manufacturing a resistive random access memory includes depositing a layer made of an active material of variable electrical resistance on a substrate containing a first electrode, forming a lower electrode; depositing an electrically conductive layer on the active material layer; etching the electrically conductive layer so as to delimit a second electrode, forming an upper electrode, facing the lower electrode; exposing at least one flank of the upper electrode to an ion beam inclined with respect to the normal to the substrate by an angle (α) comprised between 20° and 65°, so as to implant the ions in a portion of the active material layer adjacent to the flank and located under the upper electrode, the ion implantation conditions being chosen so as to create defects in the structure of the active material and to obtain an average implantation width comprised between 5 nm and 10 nm.


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