The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

Apr. 25, 2016
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventor:

Akito Nishii, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/861 (2006.01); H01L 29/868 (2006.01); H01L 29/739 (2006.01); H01L 29/78 (2006.01); H01L 29/06 (2006.01); H01L 29/32 (2006.01); H01L 29/40 (2006.01);
U.S. Cl.
CPC ...
H01L 29/8618 (2013.01); H01L 29/0638 (2013.01); H01L 29/32 (2013.01); H01L 29/408 (2013.01); H01L 29/739 (2013.01); H01L 29/78 (2013.01); H01L 29/861 (2013.01); H01L 29/868 (2013.01);
Abstract

It is an object of the present invention to provide a technique of preventing electric-field concentration in a first P-type semiconductor layer during recovery operation. A semiconductor device includes a drift layer, an N-type semiconductor layer, a first P-type semiconductor layer, a second P-type semiconductor layer, an electrode, and an insulating layer. The N-type semiconductor layer and the first P-type semiconductor layer are disposed below the drift layer while being adjacent to each other in a lateral direction. The insulating layer is disposed above the first P-type semiconductor layer while being in contact with the second P-type semiconductor layer and the electrode.


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