The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Sep. 19, 2019
Applicant:
SK Hynix Inc., Icheon-si, KR;
Inventor:
Haeng Seon Chae, Yongin-si, KR;
Assignee:
SK hynix Inc., Icheon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/36 (2006.01); G11C 29/12 (2006.01); G11C 29/20 (2006.01); G11C 29/46 (2006.01); G11C 29/56 (2006.01); G11C 29/44 (2006.01); G11C 29/18 (2006.01);
U.S. Cl.
CPC ...
G11C 29/12015 (2013.01); G11C 29/1201 (2013.01); G11C 29/20 (2013.01); G11C 29/36 (2013.01); G11C 29/46 (2013.01); G11C 29/56016 (2013.01); G11C 2029/1802 (2013.01); G11C 2029/4402 (2013.01);
Abstract
A test control circuit includes a test mode generation circuit. The test mode generation circuit may be configured to generate, while in a fast access mode, a fast test mode signal based on information included in one of a plurality of mode signals and a fast set signal. The test mode generation circuit may be configured to generate, while in a normal mode, a normal test mode signal based on information included in two or more mode signals from the plurality of mode signals and a normal set signal.