The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

Sep. 17, 2019
Applicant:

Topcon Corporation, Tokyo, JP;

Inventors:

Satoshi Yasutomi, Tokyo, JP;

Takahiro Komeichi, Tokyo, JP;

Assignee:

TOPCON CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G06F 16/29 (2019.01); G01S 17/42 (2006.01); G01S 17/89 (2020.01);
U.S. Cl.
CPC ...
G06T 15/00 (2013.01); G01S 17/42 (2013.01); G01S 17/89 (2013.01); G06F 16/29 (2019.01); G06T 2210/56 (2013.01);
Abstract

A point cloud data display system includes a target unit including a reflection target, a scanner device configured to acquire point cloud data, a surveying instrument configured to obtain a distance and an angle to the reflection target, measured coordinates and a direction angle of the scanner device, and a display device configured to display data output from the scanner device and the surveying instrument. The scanner device outputs point cloud data in association with an observation point each time of acquisition of the point cloud data. The surveying instrument outputs coordinates, a direction angle of the scanner device at the observation point. When the point cloud data, coordinates and direction angle with respect to the observation point are obtained, the display device converts point cloud data into data in a map coordinate system and displays the converted data on a display unit in association with a map.


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