The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Aug. 16, 2019
Konica Minolta, Inc., Tokyo, JP;
Yusuke Mimura, Hino, JP;
Makoto Oki, Hino, JP;
KONICA MINOLTA, INC., Tokyo, JP;
Abstract
An inspection device includes: an image acquirer that acquires an inspection target image; an edge extractor that extracts an edge from each of the inspection target image and a reference image to be used in inspecting the output image; a defect candidate region extractor that extracts a defect candidate region having a possibility of a defect by comparing the inspection target image with the reference image; an edge direction calculator that calculates a direction of the edge in the inspection target image and a direction of the edge in the reference image; and a defect determiner that determines whether the defect candidate region is a defect, on a basis of the direction of the edge in the inspection target image and the direction of the edge in the reference image at a position corresponding to the defect candidate region.