The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Jan. 25, 2019
Fanuc Corporation, Yamanashi, JP;
Yuuki Sugita, Yamanashi, JP;
Hang Cui, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
A workpiece image generation device is provided with a machining information acquisition unit, an area division unit configured to virtually divide a surface area of the workpiece into partial areas based on the surface shape information, an image acquisition unit configured to acquire a plurality of images of the workpiece captured with different angles of irradiation on the workpiece as viewed from the imaging device, an area image selection unit configured to extract partial images individually from the plurality of images of the workpiece, based on the partial areas of the surface area of the workpiece, and select partial images corresponding to the individual partial areas from the plurality of extracted partial images, an image synthesis unit configured to generate a composite image of the workpiece obtained by synthesizing the partial images, and a composite image output unit configured to output the composite image of the workpiece.