The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

Jun. 21, 2019
Applicant:

Walmart Apollo, Llc, Bentonville, AR (US);

Inventors:

Tarun Dasari, Bentonville, AR (US);

Aditya Reddy Cheruku, Bentonville, AR (US);

Kishore Sasthiri, Rogers, AR (US);

Snigdha Gutha, Bentonville, AR (US);

Alejandro Garcia, Rogers, AR (US);

Assignee:

Walmart Apollo, LLC, Bentonville, AR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01); G06T 7/90 (2017.01);
U.S. Cl.
CPC ...
G06K 9/6267 (2013.01); G06K 9/6227 (2013.01); G06K 9/6256 (2013.01); G06T 7/90 (2017.01); G06K 2209/17 (2013.01);
Abstract

Embodiments of a system for food quality image classification are disclosed for classifying food items as either damaged or not damaged, and if damaged, the type of damage. Damage classification may be performed in multiple stages, for example, RGB data may be used in a first classification, and HSV data may be used in a second classification, such as whether damage is from bruising or decay. Blurring may improve determination accuracy, and an ongoing feedback and training loop may improve accuracy results over time.


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