The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

Nov. 09, 2018
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Jianshu Li, Singapore, SG;

Sujoy Roy, Singapore, SG;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00228 (2013.01); G06K 9/00275 (2013.01); G06K 9/00281 (2013.01); G06K 9/629 (2013.01); G06K 9/6228 (2013.01); G06K 9/6251 (2013.01);
Abstract

Implementations include receiving an input image including a face, processing the input image through a global transformation network to provide a set of global transformation parameters, applying the set of global transformation parameters to the input image to provide a globally transformed image, processing the globally transformed image through a global representation learning network to provide a set of global features, processing the set of global features through a part localization network to provide a set of part localization parameters, applying the set of part localization parameters to the globally transformed image to provide a locally transformed image, processing the locally transformed image through a part representation learning network to provide a set of local features, and outputting a label representing at least one attribute depicted in the input image based on fusing global feature(s) from the set of global features, and local feature(s) from the set of local features.


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