The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Apr. 05, 2019
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
An optical measuring system includes a calibration apparatus having at least one optical marker and a code. The optical measuring system includes a memory unit that stores a metadata record with calibration parameters that have physical state and change variables that are specific to the calibration apparatus. The calibration apparatus is configured to encrypt a link to the metadata record stored in the memory unit. The optical measuring system includes an optical sensor configured to capture image data containing the at least one optical marker and the code. The optical measuring system includes a control unit configured to evaluate the image data captured by the optical sensor, decrypt the code captured by the optical sensor, access the memory unit via the link, read the metadata record stored therein, and include the read calibration parameters and the at least one optical marker in the evaluation of the image data.