The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Apr. 24, 2018
Applicant:
Fujitsu Limited, Kawasaki, JP;
Inventors:
Takanori Negishi, Nagano, JP;
Yasuhiro Kawashima, Nagano, JP;
Kazuya Yamaura, Nakano, JP;
Masao Fukushima, Suzaka, JP;
Tsuyoshi Tamaki, Ueda, JP;
Toshio Arai, Nagano, JP;
Toshiyasu Ohara, Nakano, JP;
Assignee:
FUJITSU LIMITED, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/23 (2020.01); G06F 17/12 (2006.01); G06F 111/10 (2020.01); H04N 1/32 (2006.01); G06T 17/20 (2006.01); G01S 7/292 (2006.01); H04N 1/333 (2006.01);
U.S. Cl.
CPC ...
G06F 30/23 (2020.01); G06F 17/12 (2013.01); G01S 7/2927 (2013.01); G06F 2111/10 (2020.01); G06T 17/20 (2013.01); H04N 1/32448 (2013.01); H04N 1/32454 (2013.01); H04N 1/33376 (2013.01);
Abstract
A structure analysis device includes a memory and a processor configured to obtain model information, evaluate a size of a model in accordance with the model information, select, in accordance with the evaluated size, either a direct method or an iterative method as a first algorithm of a simultaneous linear equation of a structure analysis solver that uses a finite element method, and execute structure analysis of the model by using the first algorithm.