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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11003816 B1

PDFFull Text
Date of Patent:
May. 11, 2021

Filed:

Apr. 24, 2018

Structure analysis device and structure analysis method

Applicant:

Fujitsu Limited, Kawasaki, JP;

Inventors:

Takanori Negishi, Nagano, JP;

Yasuhiro Kawashima, Nagano, JP;

Kazuya Yamaura, Nakano, JP;

Masao Fukushima, Suzaka, JP;

Tsuyoshi Tamaki, Ueda, JP;

Toshio Arai, Nagano, JP;

Toshiyasu Ohara, Nakano, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:

Staas & Halsey LLP

Primary Examiner:

Kibrom K Gebresilassie

Int. Cl.
CPC ...
G06F 30/23 (2020.01); G06F 17/12 (2006.01); G06F 111/10 (2020.01); H04N 1/32 (2006.01); G06T 17/20 (2006.01); G01S 7/292 (2006.01); H04N 1/333 (2006.01);
U.S. Cl.
CPC ...
G06F 30/23 (2020.01); G06F 17/12 (2013.01); G01S 7/2927 (2013.01); G06F 2111/10 (2020.01); G06T 17/20 (2013.01); H04N 1/32448 (2013.01); H04N 1/32454 (2013.01); H04N 1/33376 (2013.01);
Abstract

A structure analysis device includes a memory and a processor configured to obtain model information, evaluate a size of a model in accordance with the model information, select, in accordance with the evaluated size, either a direct method or an iterative method as a first algorithm of a simultaneous linear equation of a structure analysis solver that uses a finite element method, and execute structure analysis of the model by using the first algorithm.

Find Patent Forward Citations

Negishi, Takanori. (2021). Structure analysis device and structure analysis method (U.S. Patent No. 11003816). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11003816

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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