The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

Oct. 19, 2016
Applicant:

Jpmorgan Chase Bank, N.a., New York, NY (US);

Inventors:

Vladimir Knajtner, Brooklyn, NY (US);

Michel Victor, Sunnyside, NY (US);

Shahin Mahmoud Shahin, Clifton, NJ (US);

Assignee:

JPMORGAN CHASE BANK, N.A., New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 16/23 (2019.01);
U.S. Cl.
CPC ...
G06F 11/3688 (2013.01); G06F 11/3692 (2013.01); G06F 16/2358 (2019.01); G06F 16/2379 (2019.01);
Abstract

In one embodiment, a method for continuous integration automated testing in a distributed computing environment may include receiving data for a computer application into an automated testing schema; at least one computer processor executing a baseline test run and storing baseline test run results; receiving new code for the computer application at a test environment; the at least one computer processor executing a test run and storing test run results; the at least one computer processor comparing the test run results to the baseline test run results; and the at least one computer processor generating at least one report based on the comparing.


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