The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Apr. 30, 2014
Applicants:
Yi-qun Ren, Shanghai, CN;
Hai-ying Liu, Shanghai, CN;
Zhi-yuan Jing, Shanghai, CN;
Hewlett Packard Enterprise Development Lp, Houston, TX (US);
Inventors:
Assignee:
Micro Focus LLC, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3664 (2013.01); G06F 11/3688 (2013.01);
Abstract
Performing a mirror test for localization testing includes executing a mirror test, the mirror test includes an execution of actions on target controls on a master device and mimicking the actions on the target controls on a number of slave devices for localization testing, identifying the target controls on the number of slave devices to mimic the execution of the actions on the target controls of the master device, capturing at least one screenshot of the mirror test, and displaying the at least one screenshot to a user.