The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 11, 2021

Filed:

Sep. 29, 2016
Applicant:

Hewlett-packard Development Company, L.p., Spring, TX (US);

Inventors:

Marlon Gomes Lopez, Vancouver, WA (US);

Guilherme Selau Riberio, Porto Alegre, BR;

Luciano Alves, Porto Alegre, BR;

Humberto Cardoso Marchezi, Porto Alegre, BR;

Brian Schmitz Tani, Porto Alegre, BR;

Leonardo Marquezini, Porto Alegre, BR;

Eduardo Rodel, Porto Alegre, BR;

Josepe Franco Gerent, Porto Alegre, BR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06N 20/00 (2019.01); G05B 19/4065 (2006.01); G05B 23/02 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/008 (2013.01); G05B 19/4065 (2013.01); G05B 23/0243 (2013.01); G06F 11/3075 (2013.01); G06N 20/00 (2019.01); G05B 2219/32201 (2013.01);
Abstract

Example systems may relate to component failure prediction. A non-transitory computer readable medium may contain instructions to analyze a plurality of features corresponding to a component of a system. The non-transitory computer readable medium may further contain instructions to determine which of the plurality of features to use to model a failure of the component. The non-transitory computer readable medium may contain instructions to generate a plurality of models to model the failure of the component and assemble the plurality of models into a single model for predicting component failure. The non-transitory computer readable medium may further contain instructions to extract data associated with a component failure predicted by the single model and correlate the data associated with the predicted component failure with the single model.


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