The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 11, 2021
Filed:
Jul. 28, 2015
Leica Microsystems Cms Gmbh, Wetzlar, DE;
Gabriele Petri, Butzbach Griedel, DE;
Peter Euteneuer, Lahnau, DE;
Ralf Krueger, Butzbach Griedel, DE;
LEICA MICROSYSTEMS CMS GMBH, Wetzlar, DE;
Abstract
A microscope includes a light source(s) which produce an illumination beam path comprising light in a plurality of wavelength regions. A dichroic beam splitter arrangement having a dichroic mirror surface is arranged between objective optics and a tube lens in a beam path portion to produce a reflected partial beam and a transmitted partial beam. The beam splitter arrangement changes a propagation direction of the reflected partial beam relative to the illumination beam path by a specified deflection angle. The mirror surface is arranged at an angle of 22.5±7.5°. The beam splitter arrangement includes a further mirror(s) arranged in the reflected beam path. The propagation direction of the reflected partial beam is changed by the specified deflection angle using the sum of all reflections on the mirror surface and the further mirror(s).